DS90LV032AQML_13 Datasheet, PDF (3/16 Pages) Texas Instruments – 3V LVDS Quad CMOS Differential Line Receiver

DS90LV032AQML
www.ti.com
SNLS205A – NOVEMBER 2011 – REVISED APRIL 2013
Absolute Maximum Ratings ⁽¹⁾
Supply Voltage (V_CC)
Input Voltage (R_I+, R_I−)
Enable Input Voltage (En, En*)
Output Voltage (R_O)
Storage Temperature Range
Lead Temperature Range (Soldering 4 sec.)
Maximum Package Power Dissipation @ +25°C ⁽²⁾
NAD0016A Package
NAC0016A Package
Thermal Resistance
θ_JA
NAD0016A Package
NAC0016A Package
θ_JC
NAD0016A Package
NAC0016A Package
Maximum Junction Temperature
ESD Rating ⁽³⁾
−0.3V to +4V
−0.3V to +3.9V
−0.3V to (V_CC + 0.3V)
−0.3V to (V_CC + 0.3V)
−65°C ≤ T_A ≤ +150°C
+260°C
845 mW
845 mW
148°C/W
148°C/W
21°C/W
21°C/W
+150°C
4.5 KV
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2) Derate @ 6.8mW/°C
(3) Human body model, 1.5 kΩ in series with 100 pF.
Recommended Operating Conditions
Supply Voltage (V_CC)
Receiver Input Voltage
Operating Free Air Temperature (T_A)
Min
Max
Unit
+3.15
+3.45
V
Gnd
+3.0
V
−55
+85
°C
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
12
13
14
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
Temp °C
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
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