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DAC8830-EP Datasheet, PDF (3/32 Pages) Texas Instruments – 16-Bit, Ultra-Low Power, Voltage-Output Digital-to-Analog Converters
DAC8830-EP
DAC8831-EP
www.ti.com
SGLS334C – AUGUST 2006 – REVISED APRIL 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
PRODUCT
MINIMUM
RELATIVE
ACCURACY
(LSB)
DIFFERENTIAL
NONLINEARITY
(LSB)
DAC8830MCD
±1
±1
DAC8831MCD
±1
±1
POWER-
ON
RESET
VALUE
SPECIFICATION
TEMPERATURE
RANGE
PACKAGE
MARKING
PACKAGE-
LEAD
PACKAGE (2)
DESIGNATOR
Zero-Code –55°C to 125°C
8830M
SO-8
D
Zero-Code –55°C to 125°C
8831M
SO-14
D
ORDERING
NUMBER
DAC8830MCDREP
DAC8830MCDEP
DAC8831MCDREP
DAC8831MCDEP
TRANSPORT
MEDIA,
QUANTITY
Tape and Reel,
2500
Tube, 75
Tape and Reel,
2500
Tube, 50
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the
Texas Instruments website at www.ti.com.
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)(1)
VDD to AGND
Digital input voltage to DGND
VOUT to AGND
AGND, AGNDF, AGNDS to DGND
Operating temperature range
Storage temperature range
Junction temperature range (TJ max)
Power dissipation
Thermal impedance, θJA
SO-8
SO-14
Lead temperature, soldering
Vapor phase (60 s)
Infrared (15 s)
VALUE
–0.3 to 7
–0.3 to VDD + 0.3
–0.3 to VDD + 0.3
–0.3 to 0.3
–55 to 125
–65 to 150
150
(TJ max – TA)/ θJA
149.5
104.5
215
220
UNIT
V
V
V
V
°C
°C
°C
W
°C/W
°C/W
°C
°C
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
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