DAC5662 Datasheet, PDF (3/25 Pages) Texas Instruments – DUAL, 12-BIT 200 MSPS DIGITAL-TO-ANALOG CONVERTER

DAC5662
www.ti.com ................................................................................................................................................................ SLAS425B – JULY 2004 – REVISED MAY 2007
TERMINAL
NAME
NO.
DGND
15, 21
DVDD
16, 22
EXTIO
43
GSET
42
IOUTA1
46
IOUTA2
45
IOUTB1
39
IOUTB2
40
MODE
48
NC
13, 14, 35,
36
SLEEP
37
WRTA/WRTIQ
17
WRTB/SELEC
TIQ
20
TERMINAL FUNCTIONS (continued)
I/O DESCRIPTION
I
Digital ground
I
Digital supply voltage
I/O Internal reference output (bypass with 0.1 µF to AGND) or external reference input.
I
Gain-setting mode: H - 1 resistor, L - 2 resistors. Internal pullup.
O DACA current output. Full-scale with all bits of DA high.
O DACA complementary current output. Full-scale with all bits of DA low.
O DACB current output. Full-scale with all bits of DB high.
O DACB complementary current output. Full-scale with all bits of DB low.
I
Mode Select: H – Dual Bus, L – Interleaved. Internal pullup.
-
No connection
I
Sleep function control input: H – DAC in power-down mode, L – DAC in operating mode. Internal
pulldown.
I
Input write signal for PORT A (WRTIQ in interleaving mode).
I
Input write signal for PORT B (SELECTIQ in interleaving mode).
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)⁽¹⁾
Supply voltage range
Voltage between AGND and DGND
Voltage between AVDD and DVDD
Supply voltage range
Peak input current (any input)
Peak total input current (all inputs)
Operating free-air temperature range
Storage temperature range
AVDD ⁽²⁾
DVDD ⁽³⁾
DA[11:0] and DB[11:0]⁽³⁾
MODE, SLEEP, CLKA, CLKB, WRTA, WRTB⁽³⁾
IOUTA1, IOUTA2, IOUTB1, IOUTB2⁽²⁾
EXTIO, BIASJ_A, BIASJ_B, GSET⁽²⁾
UNIT
-0.5 V to 4 V
-0.5 V to 4 V
-0.5 V to 0.5 V
-0.5 V to 0.5 V
-0.5 V to DVDD + 0.5 V
-0.5 V to DVDD + 0.5 V
-1 V to AVDD + 0.5 V
-0.5 V to AVDD + 0.5 V
+20 mA
-30 mA
-40 °C to 85 °C
-65 °C to 150 °C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only and functional operation of these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Measured with respect to AGND.
(3) Measured with respect to DGND.
Copyright © 2004–2007, Texas Instruments Incorporated
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