CY74FCT2245T_16 Datasheet, PDF (3/18 Pages) Texas Instruments – 8-BIT TRANSCEIVER WITH 3-STATE OUTPUTS

CY74FCT2245T
8-BIT TRANSCEIVER
WITH 3-STATE OUTPUTS
SCCS037B – JULY 1994 – REVISED NOVEMBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP^† MAX UNIT
VIK
VCC = 4.75,
IIN = –18 mA
–0.7 –1.2 V
VOH
VCC = 4.75,
IOH = –15 mA
2.4
3.3
V
VOL
VCC = 4.75,
IOL = 12 mA
0.3 0.55 V
Rout
VCC = 4.75,
IOL = 12 mA
20
25
40 Ω
Vhys
All inputs
0.2
V
II
VCC = 5.25 V,
VIN = VCC
5 µA
IIH
VCC = 5.25 V,
VIN = 2.7 V
±1 µA
IIL
VCC = 5.25 V,
VIN = 0.5 V
±1 µA
IOZH
VCC = 5.25 V,
VOUT = 2.7 V
10 µA
IOZL
IOS^‡
VCC = 5.25 V,
VCC = 5.25 V,
VOUT = 0.5 V
VOUT = 0 V
–10 µA
–60 –120 –225 mA
Ioff
VCC = 0 V,
VOUT = 4.5 V
±1 µA
ICC
∆ICC
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
VCC = 5.25 V, VIN = 3.4 V^§, f1 = 0, Outputs open
0.1
0.2 mA
0.5
2 mA
ICCD^¶
VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open,
T/R = OE = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.06
0.12
mA/
MHz
One input switching
VIN ≤ 0.2 V or
at f1 = 10 MHz
VIN ≥ VCC – 0.2 V
IC#
VCC = 5.25 V,
Outputs open,
T/R = OE = GND
at 50% duty cycle
Eight bits switching
VIN = 3.4 V or GND
VIN ≤ 0.2 V or
at f1 = 2.5 MHz
VIN ≥ VCC – 0.2 V
at 50% duty cycle
VIN = 3.4 V or GND
0.7
1.4
1
2.4
mA
1.3 2.6||
3.3 10.6||
Ci
5
10 pF
Co
9
12 pF
† _{Typical values are at VCC = 5 V, TA = 25°C.}
‡ _{Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus}
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ _{Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND}
¶ _{This parameter is derived for use in total power-supply calculations.}
# _{IC = ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1)}
Where:
IC = Total supply current
ICC = Power-supply current with CMOS input levels
∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH = Duty cycle for TTL inputs high
NT = Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0 = Clock frequency for registered devices, otherwise zero
f1 = Input signal frequency
N1 = Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| _{Values for these conditions are examples of the ICC formula.}
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