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TPS53316 Datasheet, PDF (2/29 Pages) Texas Instruments – High-Efficiency, 5-A Step-Down Regulator with Integrated Switcher
TPS53316
SLUSAP5 – DECEMBER 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
TA
Plastic QFN
(RGT)
PACKAGE
–40°C to 85°C
ORDERING INFORMATION(1)(2)
ORDERABLE
DEVICE NUMBER
PINS
OUTPUT
SUPPLY
MINIMUM QUANTITY
TPS53316RGTR
16
Tape and reel
3000
TPS53316RGTT
16
Mini reel
250
ECO PLAN
Green (RoHS and no
Pb/Br)
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the TI
website at www.ti.com.
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free air-temperature range (unless otherwise noted)
VIN
VBST
Input voltage range
VBST(with respect to LL)
EN
FB, PS. RF/OC
Output voltage range
SW
PGD
DC
Pulse < 20ns, E=5μJ
COMP, VREG3
PGND
Operating free-air temperature, TA
Storage temperature range, Tstg
Junction temperature range, TJ
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
VALUE
–0.3 to 7
–0.3 to17
–0.3 to 7
–0.3 to 7
–0.3 to 3.7
–1 to 7
≥ –5 or <10
–0.3 to 7
–0.3 to 3.7
–0.3 to 0.3
–40 to 85
–55 to 150
–40 to 150
300
UNIT
V
V
°C
°C
°C
C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
Copyright © 2011, Texas Instruments Incorporated
Product Folder Link(s) :TPS53316