TPS2543-Q1 Datasheet, PDF (2/41 Pages) Texas Instruments – USB Charging Port Controller and Power Switch with Load Detection

TPS2543-Q1
SLVSBW2 – MARCH 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
T_A = T_J
–40°C to 125°C
ORDERING INFORMATION⁽¹⁾
PACKAGE
DEVICE
QFN16
TPS2543-Q1
TOP-SIDE MARKING
2543Q
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
over operating free-air temperature range, voltages are referenced to GND (unless otherwise noted)
LIMIT
Voltage range
IN, EN, ILIM_LO, ILIM_HI, FAULT, STATUS, ILIM_SEL,
CTL1, CTL2, CTL3, OUT
IN to OUT
–0.3 to 7
–7 to 7
DP_IN, DM_IN, DP_OUT, DM_OUT
–0.3 to (IN + 0.3) or 5.7
Input clamp current
DP_IN, DM_IN, DP_OUT, DM_OUT
±20
Continuous current in SDP or CDP
mode
DP_IN to DP_OUT or DM_IN to DM_OUT
±100
Continuous current in BC1.2 DCP
mode
DP_IN to DM_IN
±50
Continuous output current
OUT
Internally limited
Continuous output sink current
FAULT, STATUS
25
Continuous output source current
ILIM_LO, ILIM_HI
Internally limited
ESD rating
HBM
CDM
2000
500
Operating junction temperature, T_J
–40 to Internally limited
UNIT
V
mA
mA
mA
mA
mA
V
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
Submit Documentation Feedback
Product Folder Links: TPS2543-Q1
Copyright © 2013, Texas Instruments Incorporated