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OPA356-Q1 Datasheet, PDF (2/17 Pages) Texas Instruments – 200-MHz CMOS OPERATIONAL AMPLIFIER
OPA356-Q1
SBOS479 – MARCH 2009.................................................................................................................................................................................................. www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)
VS
VIN
θJA
TA
TSTG
TJ
TLEAD
Supply voltage, V+ to V–
Signal input terminals voltage range(2)
V– current(2)
Output short-circuit duration(3)
Thermal impedance, junction to free air(4)
Operating free-air temperature range
Storage temperature range
Junction temperature
Lead temperature (soldering, 10 s)
7.5 V
–0.5 V to (V+ + 0.5 V)
10 mA
Continuous
150°C/W
–40°C to 125°C
–65°C to 150°C
160°C
300°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should
be current limited to 10 mA or less.
(3) Short-circuit to ground one amplifier per package.
(4) The package thermal impedance is calculated in accordance with JESD 51-5.
RECOMMENDED OPERATING CONDITIONS
VS
Supply voltage, V– to V+
TA
Operating free-air temperature
MIN MAX UNIT
2.7 5.5 V
–40 125 °C
2
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