CD40109B-Q1 Datasheet, PDF (2/14 Pages) Texas Instruments – CMOS QUAD LOW-TO-HIGH VOLTAGE SHIFTER

CD40109B-Q1
SCHS380 A – JUNE 2010 – REVISED AUGUST 2011
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
TRUTH TABLE⁽¹⁾
INPUTS
A, B, C, D
0
1
X
ENABLE
A, B, C, D
1
1
0
OUTPUTS
E, F, G, H
0
1
Z
(1) 0 = V_SS, 1 = V_CC at inputs and V_DD at outputs, X = Don't care, Z =
High impedance
Functional Diagram (1 of 4 Units)
Logic Diagram (1 of 4 Units)
2
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