TL431-Q1 Datasheet, PDF (12/26 Pages) Texas Instruments – ADJUSTABLE PRECISION SHUNT REGULATOR

TL431−Q1
ADJUSTABLE PRECISION SHUNT REGULATOR
SGLS302D − MARCH 2005 − REVISED MARCH 2013
TYPICAL CHARACTERISTICS
STABILITY BOUNDARY CONDITIONS^†
FOR ALL TL431 AND TL431A DEVICES
(EXCEPT FOR SOT23-3, SC-70, AND Q-TEMP DEVICES)
100
A V_KA = V_ref
90 ^{B V}KA ^{= 5 V}
C V_KA = 10 V
80 ^{D V}KA ^{= 15 V}f
T_A = 25°C
B
70
60
Stable
50
Stable
C
A
40
30
D
20
10
0
0.001
0.01
0.1
1
10
C_L − Load Capacitance − μF
150 Ω
I_KA
+
C_L
V_BATT
−
TEST CIRCUIT FOR CURVE A
I_KA
R1 = 10 kΩ
150 Ω
C_L
R2
+
V_BATT
−
TEST CIRCUIT FOR CURVES B, C, AND D
STABILITY BOUNDARY CONDITIONS^†
FOR ALL TL431B, TL432, SOT-23, SC-70, AND Q-TEMP DEVICES
100
A V_KA = V_ref
90 ^{B V}KA ^{= 5 V}
C V_KA = 10 V
80 ^{D V}KA ^{= 15 V}f
70
T_A = 25°C
60
Stable
50
A
40
30
20
10
B
C
Stable
A
D
B
0
0.001
0.01
0.1
1
10
C_L − Load Capacitance − μF
† _{The areas under the curves represent conditions that may cause the}
device to oscillate. For curves B, C, and D, R2 and V+ were adjusted
to establish the initial V_KA and I_KA conditions with C_L = 0. V_BATT and
C_L then were adjusted to determine the ranges of stability.
Figure 16
150 Ω
I_KA
+
C_L
V_BATT
−
TEST CIRCUIT FOR CURVE A
I_KA
R1 = 10 kΩ
150 Ω
C_L
R2
+
V_BATT
−
TEST CIRCUIT FOR CURVES B, C, AND D
12
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