TC240 Datasheet, PDF (11/19 Pages) Texas Instruments – 780- × 488-PIXEL CCD IMAGE SENSOR

TC240
780- × 488-PIXEL CCD IMAGE SENSOR
SOCS005A – OCTOBER 1985 – REVISED DECEMBER 1991
electrical characteristics over recommended operating range of supply voltage, T_A = –10°C to 45°C
PARAMETER
MIN TYP†
MAX UNIT
Dynamic range (see Note 2)
Antiblooming disabled (see Note 3)
60
dB
Charge conversion factor
1.4
1.6
1.8 µV/e
Charge transfer efficiency (see Note 4)
0.9999 0.99995
Signal response delay time, τ (see Note 5 and Figure 11)
18
20
22
ns
Gamma (see Note 6)
0.97
0.98
Output resistance
700
800
Ω
Noise voltage
1/f noise (5 kHz)
Random noise (f = 100 kHz)
0.13
µV/√HZ
0.11
Noise equivalent signal
120
electrons
ADB (see Note 7)
20
Rejection ratio at 4.77 MHz
SRGn (see Note 8)
ABG (see Note 9)
40
dB
20
Supply current
5
mA
IAG
12000
SRG 1, 2, 3
120
Input capacitance, Ci
ABG
TRG
4000
pF
350
SAG
14000
† _{All typical values are at TA = 25°C.}
NOTES: 2. Dynamic range is – 20 times the logarithm of the mean noise signal divided by the saturation output signal.
3. For this test, the antiblooming gate must be biased at the intermediate level.
4. Charge transfer efficiency is one minus the charge loss per transfer in the output register. The test is performed in the dark using
an electrical input signal.
5. Signal response delay time is the time between the falling edge of the SRG clock pulse and the output signal valid state.
6. Gamma (γ) is the value of the exponent in the equation below for two points on the linear portion of the transfer function curve (this
ǒ Ǔ + ǒ Ǔ value represents points near saturation):
g
Exposure (2)
Output signal (2)
Exposure (1)
Output signal (1)
7. ADB rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ADB.
8. SRGn rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at SRGn.
9. ABG rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ABG.
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