XTR108-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – TWO-WIRE TRANSMITTER

XTR108-DIE
www.ti.com
SBOS615 – JUNE 2012
TWO-WIRE TRANSMITTER
"SMART" PROGRAMMABLE WITH SIGNAL CONDITIONING
FEATURES
1
• Complete Transmitter + RTD Linearization
• Two-Wire Output
• Eliminates Potentiometers and Trimming
• Digitally Calibrated
• Serial SPI Bus Interface
APPLICATIONS
• Remote RTD Transmitters
• Pressure Bridge Transmitters
• Strain Gate Transmitters
• SCADA Remote Data Acquisition
• Weighing Systems
• Industrial Process Control
DESCRIPTION
The XTR108 is a “smart” programmable, two-wire transmitter designed for temperature and bridge sensors. Zero,
span, and linearization errors in the analog signal path can be calibrated via a standard digital serial interface,
eliminating manual trimming. Non-volatile external EEPROM stores calibration settings.
The all-analog signal path contains an input multiplexer, autozeroed programmable-gain instrumentation
amplifier, dual programmable current sources, linearization circuit, voltage reference, sub-regulator, internal
oscillator, control logic, and an output current amplifier. Programmable level shifting compensates for sensor DC
offsets. Selectable up- and down-scale output indicates out-of-range and burnout per NAMUR NE43. Automatic
reset is initiated when supply is lost.
Current sources, steered through the multiplexer, can be used to directly excite RTD temperature sensors,
pressure bridges, or other transducers. An uncommitted operational amplifier can be used to convert current into
a voltage.
PRODUCT
XTR108
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE ⁽²⁾
ORDERABLE PART NUMBER
Bare die in waffle pack
XTR108TDD1
XTR108TDD2
PACKAGE QUANTITY
130
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated