XTR105-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – 4-20mA CURRENT TRANSMITTER WITH SENSOR EXCITATION AND LINEARIZATION

XTR105-DIE
www.ti.com
SBOS648 – AUGUST 2012
4-20mA CURRENT TRANSMITTER WITH SENSOR EXCITATION AND LINEARIZATION
FEATURES
1
• Low Unadjusted Error
• Two Precision Current Sources
• Linearization
• 2- or 3-Wire RTD Operation
• Low Offset Drift
• Low Output Current Noise
• High PSR
• High CMR
• Wide Supply Range
APPLICATIONS
• Industrial Process Control
• Factory Automation
• SCADA Remote Data Acquisition
• Remote Temperature and Pressure
Transducers
DESCRIPTION
The XTR105 is a monolithic 4-20mA, 2-wire current transmitter with two precision current sources. It provides
complete current excitation for platinum RTD temperature sensors and bridges, instrumentation amplifiers, and
current output circuitry on a single integrated circuit.
Versatile linearization circuitry provides a 2nd-order correction to the RTD, typically achieving a 40:1
improvement in linearity.
Instrumentation amplifier gain can be configured for a wide range of temperature or pressure measurements.
Total unadjusted error of the complete current transmitter is low enough to permit use without adjustment in
many applications. This includes zero output current drift, span drift, and nonlinearity. The XTR105 operates on
loop power-supply voltages.
PRODUCT
XTR105
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in waffle pack⁽²⁾
XTR105TDC1
80
XTR105TDC2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated