TRF371109 Datasheet, PDF (1/47 Pages) Texas Instruments – Direct Downconversion Receiver

TRF371109
www.ti.com
SLWS225B – DECEMBER 2010 – REVISED MAY 2011
Direct Downconversion Receiver
Check for Samples: TRF371109
FEATURES
1
•2 Frequency Range: 300 MHz to 1700 MHz
• Integrated Baseband Programmable Gain
Amplifier
• On-Chip Programmable Baseband Filter
• High Cascaded IP3: 27 dBm at 900 MHz
• High IP2: 68 dBm at 900 MHz
• Hardware and Software Power Down
• Three-Wire Serial Interface
• Single Supply: 4.5-V to 5.5-V Operation
• Silicon Germanium Technology
APPLICATIONS
• Multicarrier Wireless Infrastructure
• WiMAX
• High-Linearity Direct-Downconversion
Receiver
• LTE (Long Term Evolution)
DESCRIPTION
The TRF371109 is a highly linear direct-conversion
quadrature receiver. The TRF371109 integrates
balanced I and Q mixers, LO buffers, and phase
splitters to convert an RF signal directly to I and Q
baseband. The on-chip programmable gain amplifiers
allow adjustment of the output signal level without the
need for external variable gain (attenuator) devices.
The TRF371109 integrates programmable baseband
low-pass filters that attenuate nearby interference,
eliminating the need for an external baseband filter.
Housed in a 7-mm × 7-mm VQFN package, the
TRF371109 provides the smallest and most
integrated receiver solution available for
high-performance equipment.
To Microcontroller
To Microcontroller
RF_IN
GNDDIG
VCCDIG
CHIP_EN
VCCMIX1
GND
MIX_INP
MIX_INN
GND
VCCMIX2
NC
NC
GND
48 47 46 45 44 43 42 41 40 39 38 37
1
36
2
35
3
34
4
33
5
32
6
31
TRF371109
7
30
8
29
9
28
10
27
11
26
12
25
13 14 15 16 17 18 19 20 21 22 23 24
VCCBBI
GND
BBI_OUTP
BBI_OUTN
GND
LO_IP
LO_IN
VCCLO
BBQ_OUTP
BBQ_OUTN
GND
VCCBBQ
To ADC I
LO_IN
To ADC Q
30 kW
1
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010–2011, Texas Instruments Incorporated