TPS65197 Datasheet, PDF (1/7 Pages) Texas Instruments – 8-Channel Level-Shifter Supporting Different Charge-Sharing Methods and Panel

TPS65197
www.ti.com
SLVSBD7 – APRIL 2012
8-Channel Level-Shifter Supporting Different Charge-Sharing Methods and Panel
Discharge
Check for Samples: TPS65197
FEATURES
1
• 8-Channel Level-Shifter Supporting STV,
RESET, 6 × CLK
• 2-Channel Panel Discharge
• High Output-Voltage Level up to 45 V
• Low Output-Voltage Level Down to –20 V
• Selectable Charge-Sharing
– Disabled
– Method 1
– Method 2
• Supports 100-kHz Clock Operating Frequency
• 28-Terminal 4-mm × 4-mm QFN Package
DESCRIPTION
The TPS65197 is an 8-channel level-shifter with
discharge function intended for use in LCD display
applications such as TVs and monitors.
The device converts the timing-controller (T-CON)
logic-level signals to the high-level signals needed by
the gate-in-panel (GIP) display.
The clock outputs, CLKOUTx, support normal
operation and two different charge-sharing methods,
which can be used to improve picture quality and
power consumption. At power down, all outputs follow
their input signals as long as possible; when the
discharge function is used, the outputs are pulled
high (V_GH).
APPLICATIONS
• Gate-in-Panel (GIP) LCD TVs and Monitors
SEL_CS
CLKIN1
CLKIN2
CLKIN3
CLKIN4
CLKIN5
CLKIN6
STVIN
RESETIN
DIS_SENSE
VGH
VGL1
VGL2
GND
VGH
VGL1
VGH
V_GL1
VGH
VGH
VGL1
VGH
VGL1
Charge-
Sharing
logic
VGL1
VGH
VGL1
V_REF
VGH
VGL1
VGH
VGL1
VGH
VGL1
VGH
Logic all outputs = VGH
when DIS_SENSE < VREF
VGL2
CLKOUT1
CS_1
CLKOUT2
CS_2
CLKOUT3
CS_3
CLKOUT4
CS_4
CLKOUT5
CLKOUT6
STVOUT
RESETOUT
DISCH1
DISCH2
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated