TPS51103 Datasheet, PDF (1/17 Pages) Texas Instruments – INTEGRATED LDO WITH SWITCHOVER CIRCUIT FOR NOTEBOOK COMPUTERS

TPS51103
www.ti.com ...................................................................................................................................................................................................... SLUS808 – JUNE 2008
INTEGRATED LDO WITH SWITCHOVER CIRCUIT FOR NOTEBOOK COMPUTERS
FEATURES
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• Wide Input Voltage Range: 4.5 V to 28 V
• 5-V/3.3-V, 100-mA, LDO Output
• Glitch Free Switch Over Circuit
• Always-On 3.3-V, 5-mA LDO Output for RTC
• 250 kHz Clock Output for Charge Pump
• Thermal Shutdown (Non-latch)
• 10Ld QFN (DRC) Package
APPLICATIONS
• Notebook Computers
• Mobile Digital Consumer Products
TYPICAL APPLICATION CIRCUIT
DESCRIPTION
The TPS51103 integrates three LDOs. The 5-V and
3.3-V LDOs are both rated at 100 mA and also
include a glitch-free switch-over feature allowing for
optimized battery life. An additional 3.3-V LDO is
designed to provide an always on power output for
the real time clock (RTC). The TPS51103 integrates
a clock output to use with an external charge pump.
The TPS51103 offers an innovative solution for
optimizing the complex and multiple power rails
typically found in a Notebook Computer. The
TPS51103 is available in the 10-pin QFN package
and is specified from –40°C to 85°C.
A2
V15
C2
C8
1 mF
AC1
C5
0.1 mF
AC2
C1
A1
5V_IN
C4 C6 C7
0.1 mF 0.1 mF 0.1 mF
TPS51103DRC
1 VCLK
V5IN 10
2 GND
VREG5 9
3.3 V/5 mA
3 VRTC3
VIN 8
EN5
4 EN5
VREG3 7
5 EN3
EN3
C3
1 mF
V3IN 6
5V_IN
5 V/100 mA
V_IN
(4.5 V to 28 V
3.3 V/100 mA
3.3V_IN
C2 C1 C0
10 mF 10 mF 10 mF
UDG-08017
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated