TPS40007-DIE Datasheet, PDF (1/6 Pages) Texas Instruments – LOW-INPUT, HIGH EFFICIENCY SYNCHRONOUS BUCK CONTROLLER

TPS40007-DIE
www.ti.com
SLUSBS7 – NOVEMBER 2013
LOW-INPUT, HIGH EFFICIENCY SYNCHRONOUS BUCK CONTROLLER
Check for Samples: TPS40007-DIE
FEATURES
1
•2 Low Output Voltage
• Predictive Gate Drive™ N-Channel MOSFET
Drivers for Higher Efficiency
• Externally Adjustable Soft-Start and
Overcurrent Limit
• Frequency Voltage-Mode Control
• Source/Sink With V_OUT Prebias
• Thermal Shutdown
• Internal Boostrap Diode
APPLICATIONS
• Networking Equipment
• Telecom Equipment
• Base Stations
• Servers
• DSP Power
• Power Modules
DESCRIPTION
The TPS40007-DIE is a controller for low-voltage, non-isolated synchronous buck regulators. This controller
drives an N-channel MOSFET for the primary buck switch, and an N-channel MOSFET for the synchronous
rectifier switch, thereby achieving very high-efficiency power conversion. In addition, the device controls the
delays from main switch off to rectifier turn-on and from rectifier turn-off to main switch turn-on in such a way as
to minimize diode losses (both conduction and recovery) in the synchronous rectifier with TI’s proprietary
Predictive Gate Drive technology. The reduction in these losses is significant and increases efficiency. For a
given converter power level, smaller FETs can be used, or heat sinking can be reduced or even eliminated.
The current-limit threshold is adjustable with a single resistor connected to the device. The TPS40007-DIE
controller implements a closed-loop soft-start function.
PRODUCT
TPS40007
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in waffle pack⁽²⁾
TPS40007TDA3
200
TPS40007TDA2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Predictive Gate Drive is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated