TPS40000_16 Datasheet, PDF (1/24 Pages) Texas Instruments – LOW-INPUT VOLTAGE-MODE SYN CHRONOUS BUCK CONTROLLER

TPS40000, TPS40001
TPS40002, TPS40003
TPS40004, TPS40005
SLUS507D − JANUARY 2002 − REVISED NOVEMBER 2005
LOWĆINPUT VOLTAGEĆMODE
SYNCHRONOUS BUCK CONTROLLER
FEATURES
D Operating Input Voltage 2.25 V to 5.5 V
D Output Voltage as Low as 0.7 V
D 1% Internal 0.7 V Reference
D Predictive Gate Drivet N-Channel MOSFET
Drivers for Higher Efficiency
D Externally Adjustable Soft-Start and
Overcurrent Limit
D Source-Only Current or Source/Sink Current
D Versions for Starting Into V_OUT Pre-Bias
D 10-Lead MSOP PowerPadt Package for
Higher Performance
D Thermal Shutdown
D Internal Boostrap Diode
D Fixed-Frequency, Voltage-Mode Control
− TPS40000/1/4 300-kHz
− TPS40002/3/5 600-kHz
SIMPLIFIED APPLICATION DIAGRAM
APPLICATIONS
D Networking Equipment
D Telecom Equipment
D Base Stations
D Servers
D DSP Power
D Power Modules
DESCRIPTION
The TPS4000x are controllers for low-voltage,
non-isolated synchronous buck regulators. These
controllers drive an N-channel MOSFET for the
primary buck switch, and an N-channel MOSFET
for the synchronous rectifier switch, thereby
achieving very high-efficiency power conversion. In
addition, the device controls the delays from main
switch off to rectifier turn-on and from rectifier
turn-off to main switch turn-on in such a way as to
minimize diode losses (both conduction and
recovery) in the synchronous rectifier with TI’s
proprietary Predictive Gate Drivet technology. The
reduction in these losses is significant and increases
efficiency. For a given converter power level, smaller
FETs can be used, or heat sinking can be reduced
or even eliminated.
VIN
TPS40000
1 ILIM
BOOT 10
2 FB
HDRV 9
3 COMP
4 SS/SD
SW 8
VDD 7
VOUT
5 GND
LDRV 6
PowerPADt and Predictive Gate Drivet are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
www.ti.com
UDG−01141
Copyright  2005, Texas Instruments Incorporated
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