TPD4S012_14 Datasheet, PDF (1/13 Pages) Texas Instruments – 4-CHANNEL ESD SOLUTION FOR USB-HS/USB OTG/USB CHARGER INTERFACE

TPD4S012
www.ti.com
SLVS928A – MARCH 2009 – REVISED NOVEMBER 2009
4-CHANNEL ESD SOLUTION FOR USB-HS/USB OTG/USB CHARGER INTERFACE
Check for Samples: TPD4S012
FEATURES
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• Integrated ESD Clamps for D+, D–, V_BUS, and
ID Pins to Provide Single-Chip ESD Protection
for USB High Speed, USB-OTG, and USB
Charger Interface
• Special Snap Back Technology Allows
High-voltage Tolerance During Normal
Operation while Reducing the Clamp Voltage
during System Level ESD Stress
• USB Signal Pins (D+, D–, ID)
– 0.8-pF Line Capacitance
– Tolerates 6 V Signal
• V_BUS Line (V_BUS)
– 11-pF Line Capacitance
– Tolerates 20 V Signal
• Flow-Through Pin Mapping for the High-Speed
Lines Ensures Zero Additional Skew Due to
Board Layout While Placing the ESD
Protection Chip Near the Connector
• Supports Data Rates in Excess of 480 Mbps
• IEC 61000-4-2 (Level 4) System Level ESD
Compliance Measured at the D+, D–, and ID
Pins
– ±10-kV IEC 61000-4-2 Contact Discharge
– ±10-kV IEC 61000-4-2 Air-Gap Discharge
• 3 Amps Peak Pulse Current (8/20 μs Pulse) for
V_BUS and D+, D–, and ID Lines
• Industrial Temperature Range: –40°C to 85°C
APPLICATIONS
• Cellular Phones
• Digital Cameras
• Global Positioning Systems (GPS)
• Portable Digital Assistants (PDA)
• Portable Computers
DRY PACKAGE
(TOP VIEW)
D+ 1
6 ^V_BUS
D– 2 5 N.C.
ID 3 4 GND
YFP PACKAGE
(TOP VIEW)
D+
VIEW _D–
PRE V_BUS
A1 A2
B1 B2
C1 C2
GND
ID
V_BUS
N.C. – Not internally connected
D+, D–, and ID pins are exact equivalent
ESD clamp circuits. Any of these pins can
be connected to any other D+, D–, or ID
pin if it becomes easier to route the traces
from the USB connector.
DESCRIPTION
The TPD4S012 is a four-channel electrostatic
discharge (ESD) solution for USB charger or USB
on-the-go (OTG) interface. In many cell phone
applications, the USB connector is the de facto
communication port for external communications like
high-speed data transfer, audio signal, charging,
car-kit, etc. In order to support different interfaces, the
USB port needs to handle different voltage levels. For
example, some chargers require the V_BUS port of the
USB connector to handle in excess of the normal
V_BUS voltage per USB specifications. The TPD4S012
offers combinations of two different clamp voltages to
match the voltage tolerances of the different signal
interfaces using the common USB connector. Refer
to Figure 5-6 & Figure 9-12, special snap back
technology allows high-voltage tolerance during
normal operation while reducing the clamp voltage
during system level ESD stress.
The TPD4S012 conforms to IEC61000-4-2 (Level 4)
ESD. The device is offered in space-saving packages
with flow-through pin mapping.
The TPD4S012 is characterized for operation over
ambient air temperature of –40°C to 85°C.
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated