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TMP300_15 Datasheet, PDF (1/18 Pages) Texas Instruments – 1.8V, Resistor-Programmable TEMPERATURE SWITCH and ANALOG OUT TEMPERATURE SENSOR in SC70
TMP300
www.ti.com
SBOS335C – JUNE 2005 – REVISED JANUARY 2011
1.8V, Resistor-Programmable
TEMPERATURE SWITCH and
ANALOG OUT TEMPERATURE SENSOR in SC70
Check for Samples: TMP300
FEATURES
1
•2 ACCURACY: ±1°C (typical at +25°C)
• PROGRAMMABLE TRIP POINT
• PROGRAMMABLE HYSTERESIS: 5°C/10°C
• OPEN-DRAIN OUTPUTS
• LOW-POWER: 110mA (max)
• WIDE VOLTAGE RANGE: +1.8V to +18V
• OPERATION: –40°C to +150°C
• ANALOG OUT: 10mV/°C
• SC70-6 AND SOT23-6 PACKAGES
APPLICATIONS
• POWER-SUPPLY SYSTEMS
• DC-DC MODULES
• THERMAL MONITORING
• ELECTRONIC PROTECTION SYSTEMS
DESCRIPTION
The TMP300 is a low-power, resistor-programmable,
digital output temperature switch. It allows a threshold
point to be set by adding an external resistor. Two
levels of hysteresis are available. The TMP300 has a
VTEMP analog output that can be used as a testing
point or in temperature-compensation loops.
With a supply voltage as low as 1.8V and low current
consumption, the TMP300 is ideal for power-sensitive
systems.
Available in two micropackages that have proven
thermal characteristics, this part gives a complete and
simple solution for users who need simple and
reliable thermal management.
V+
TMP300
TSET 1
GND 2
OUT 3
6 V+
5 VTEMP
4 HYSTSET
SC70-6, SOT23-6
VTEMP
TSET
RSET
Proportional
3mA
to TA
210kW(1)
RPULL-UP
OUT
TMP300
HYSTSET
NOTE: (1) Thinfilm resistor with approximately 10% accuracy;
however, this accuracy error is trimmed out at the factory.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2011, Texas Instruments Incorporated