TMP104 Datasheet, PDF (1/24 Pages) Texas Instruments – Low-Power, Digital Temperature Sensor with SMAART Wire Interface

TMP104
www.ti.com
SBOS564A – NOVEMBER 2011 – REVISED NOVEMBER 2011
Low-Power, Digital Temperature Sensor
with SMAART Wire Interface
Check for Samples: TMP104
FEATURES
1
•2 Multiple Device Access (MDA):
– Global Read/Write Operations
• SMAART Wire Interface
• Resolution: 8 Bits
• Accuracy: ±0.5°C Typ (–10°C to +100°C)
• Low Quiescent Current:
– 3 μA Active I_Q at 0.25 Hz
– 1 μA Shutdown
• Supply Range: 1.4 V to 3.6 V
• Digital Output
• Package: 0.8-mm (±5%) × 1-mm (±5%) 4-Ball
WCSP (DSBGA)
APPLICATIONS
• Handsets
• Notebooks
DESCRIPTION
The TMP104 is a digital output temperature sensor in
a four-ball wafer chip-scale package (WCSP). The
TMP104 is capable of reading temperatures to a
resolution of 1°C.
The TMP104 features a SMAART wire interface that
supports daisy-chain configurations. In addition, the
interface supports multiple device access (MDA)
commands that allow the master to communicate with
multiple devices on the bus simultaneously,
eliminating the need to send individual commands to
each TMP104 on the bus.
Up to 16 TMP104s can be tied together in parallel
and easily read by the host. The TMP104 is
especially
ideal
for
space-constrained,
power-sensitive applications with multiple
temperature measurement zones that must be
monitored.
The TMP104 is specified for operation over a
temperature range of –40°C to +125°C.
Host
TX
RX
TYPICAL APPLICATION
V_CC
V_CC
V_CC
V_CC
RX_1
Device₍₁₎
RX_2
TX_1
Device₍₂₎
TX_2
RX_(N - 1)
Device_{(N -1)}
RX_N
TX_(N - 1)
Device_(N)
TX_(N)
Daisy-Chain
Configuration
Up to 16 TMP104 Devices in Daisy-Chain
1
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated