TM497GU8 Datasheet, PDF (1/7 Pages) Texas Instruments – 4194304-WORD BY 8-BIT DYNAMIC RAM MODULE

D Organization . . . 4 194304 × 8
D Single 5-V Power Supply (±10% Tolerance)
D 30-Pin Single-In-Line Memory Module
(SIMM) for Use With Sockets
D Utilizes Two 16-Megabit Dynamic RAMs in
Plastic Small-Outline J-Lead (SOJ)
Packages
D Long Refresh Period
32 ms (2048 Cycles)
D All Inputs, Outputs, Clocks Fully TTL
Compatible
D 3-State Output
D Performance Ranges:
ACCESS ACCESS ACCESS READ OR
TIME
TIME TIME WRITE
tRAC
(MAX)
tAA tCAC
(MAX) (MAX)
CYCLE
(MIN)
’497GU8-60 60 ns
30 ns 15 ns 110 ns
’497GU8-70 70 ns
35 ns 18 ns 130 ns
’497GU8-80 80 ns
40 ns 20 ns 150 ns
D Common CAS Control for Eight Common
Data-In and Data-Out Lines
D Low Power Dissipation
D Operating Free-Air Temperature Range
0°C to 70°C
D Enhanced Page-Mode Operation With
CAS-Before-RAS ( CBR), RAS-Only, and
Hidden Refresh
description
The TM497GU8 is a 4M-byte dynamic
random-access memory module organized as
4 194 304 × 8 bits in a 30-pin leadless single-in-line
memory module (SIMM).
The SIMM is composed of two TMS417400DJ,
4 194 304 × 4-bit dynamic RAMs in 24/26-lead
plastic small-outline J-lead (SOJ) packages
mounted on a substrate with decoupling capaci-
tors.
The TM497GU8 is available in the U single-sided,
leadless module for use with sockets and is
characterized for operation from 0°C to 70°C.
TM497GU8
4194304-WORD BY 8-BIT
DYNAMIC RAM MODULE
SMMS498A– APRIL 1994 – REVISED JUNE 1995
U SINGLE-IN-LINE PACKAGE
( TOP VIEW )
VCC ₁
CAS 2
DQ1 3
A0 4
A1 5
DQ2 6
A2 7
A3 8
VSS 9
DQ3 10
A4 11
A5 12
DQ4 13
A6 14
A7 15
DQ5 16
A8 17
A9 18
A10 19
DQ6 20
W 21
VSS 22
DQ7 23
NC 24
DQ8 25
NC 26
RAS 27
NC 28
NC 29
VCC 30
PIN NOMENCLATURE
A0 – A10
CAS
DQ1 – DQ8
NC
RAS
VCC
VSS
W
Address Inputs
Column-Address Strobe
Data In / Data Out
No Internal Connection
Row-Address Strobe
5-V Supply
Ground
Write Enable
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1995, Texas Instruments Incorporated
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
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