TM2SJ64EPN Datasheet, PDF (1/45 Pages) Texas Instruments – SYNCHRONOUS DYNAMIC RAM MODULES ─ SODIMM

TM2SJ64EPN 2ā097ā152 BY 64ĆBIT
SYNCHRONOUS DYNAMIC RAM MODULES Ċ SODIMM
D Organization: 2 097 152 x 64 Bits
D Single 3.3-V Power Supply
(±10% Tolerance)
D Designed for 66-MHz 4-Clock Systems
D JEDEC 144-Pin Small-Outline Dual-In-Line
Memory Module (SODIMM) Without Buffer
for Use With Socket
D Uses Eight 16M-Bit Synchronous Dynamic
RAMs (SDRAMs) (2M × 8-Bit) in Plastic Thin
Small-Outline Packages (TSOP)
D Byte-Read/Write Capability
D Read Latencies 2 and 3 Supported
D Performance Ranges:
SMMS697B − AUGUST 1997 − REVISED FEBRUARY 1998
D Support Burst-Interleave and
Burst-Interrupt Operations
D Burst Length Programmable to 1, 2, 4,
and 8
D Two Banks for On-Chip Interleaving
(Gapless Access)
D Ambient Temperature Range
0°C to 70°C
D Gold-Plated Contacts
D Pipeline Architecture
D High-Speed, Low-Noise Low-Voltage TTL
(LVTTL) Interface
D Serial Presence Detect (SPD) Using
EEPROM
’2SJ64EPN-10
† _{CL = CAS latency}
SYNCHRONOUS
CLOCK CYCLE
TIME
(CtLC=K33)^†
tCK2
(CL = 2)
10 ns
15 ns
ACCESS TIME
CLOCK TO
OUTPUT
tAC3
tAC2
(CL = 3) (CL = 2)
7 ns
8 ns
REFRESH
INTERVAL
64 ms
description
The TM2SJ64EPN is a 16M-byte, 144-pin small-outline dual-in-line memory module (SODIMM). The SODIMM
is composed of eight TMS626812ADGE, 2 097 152 x 8-bit SDRAMs, each in a 400-mil, 44-pin plastic thin
small-outline package (TSOP) mounted on a substrate with decoupling capacitors. See the TMS626812A data
sheet (literature number SMOS691).
operation
The TM2SJ64EPN operates as eight TMS626812ADGE devices that are connected as shown in the
TM2SJ64EPN functional block diagram.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1998, Texas Instruments Incorporated
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