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SN75C198DR Datasheet, PDF (1/18 Pages) Texas Instruments – QUADRUPLE LOW-POWER LINE DRIVERS
D Meets ANSI EIA / TIA-232-E and ITU
Recommendation V.28
D Very Low Supply Current
D Sleep Mode:
3-State Outputs in High-Impedance State
Ultra-Low Supply Current . . . 17 µA Typ
D Improved Functional Replacement for:
SN75188,
Motorola MC1488,
National Semiconductor DS14C88, and
DS1488
D CMOS- and TTL -Compatible Data Inputs
D On-Chip Slew-Rate Limit . . . 30 V/µs
D Output Current Limit . . . 10 mA Typ
D Wide Supply Voltage Range . . . ± 4.5 V
to ± 15 V
SN75C198
QUADRUPLE LOW-POWER LINE DRIVERS
SLLS051C – JULY 1990 – REVISED MARCH 1997
D OR N PACKAGE
(TOP VIEW)
VCC – 1
1A 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC+
13 SM
12 4A
11 4Y
10 3B
9 3A
8 3Y
NOT RECOMMENDED FOR NEW DESIGNS
description
The SN75C198 is a monolithic low-power BI-MOS device containing four low-power line drivers designed to
interface data terminal equipment (DTE) with data circuit-terminating equipment (DCE) in conformance with the
specifications of ANSI EIA / TIA-232-E. The drivers of the SN75C198 are similar to those of the SN75C188
quadruple driver. The drivers have a controlled-output slew rate that is limited to a maximum of 30 V/µs. This
feature eliminates the need for external components.
The sleep-mode input, SM, can switch the outputs to high impedance, which avoids the transmission of
corrupted data during power-up and allows significant system power savings during data-off periods.
The SN75C198 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE
INPUTS
SM A B
OUTPUT
Y
HHH
L
HLX
H
HX L
H
LXX
Z
H = high level, L = low level,
X = irrelevant, Z= high impedance
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1997, Texas Instruments Incorporated
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