SN75C1167NSE4 Datasheet, PDF (1/20 Pages) Texas Instruments – DUAL DIFFERENTIAL DRIVERS AND RECEIVERS

SN65C1167
SN75C1167, SN65C1168, SN75C1168
www.ti.com
SLLS159F – MARCH 1993 – REVISED NOVEMBER 2009
DUAL DIFFERENTIAL DRIVERS AND RECEIVERS
Check for Samples: SN65C1167 SN75C1167 SN65C1168 SN75C1168
FEATURES
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• Meet or Exceed Standards TIA/EIA-422-B and
ITU Recommendation V.11
• BiCMOS Process Technology
• Low Supply-Current Requirements: 9 mA Max
• Low Pulse Skew
• Receiver Input Impedance . . . 17 kΩ Typ
• Receiver Input Sensitivity . . . ±200 mV
• Receiver Common-Mode Input Voltage Range
of −7 V to 7 V
• Operate From Single 5-V Power Supply
• Glitch-Free Power-Up/Power-Down Protection
• Receiver 3-State Outputs Active-Low Enable
for SN65C1167 and SN75C1167 Only
• Improved Replacements for the MC34050 and
MC34051
SN65C1167 . . . DB OR NS PACKAGE
SN75C1167 . . . DB, N, OR NS PACKAGE
(TOP VIEW)
1B 1
1A 2
1R 3
RE 4
2R 5
2A 6
2B 7
GND 8
16 V_CC
15 1D
14 1Y
13 1Z
12 DE
11 2Z
10 2Y
9 2D
SN65C1168 . . . N, NS, OR PW PACKAGE
SN75C1168 . . . DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1B 1
1A 2
1R 3
1DE 4
2R 5
2A 6
2B 7
GND 8
16 V_CC
15 1D
14 1Y
13 1Z
12 2DE
11 2Z
10 2Y
9 2D
DESCRIPTION
The SN65C1167, SN75C1167, SN65C1168, and SN75C1168 dual drivers and receivers are integrated circuits
designed for balanced transmission lines. The devices meet TIA/EIA-422-B and ITU recommendation V.11.
The SN65C1167 and SN75C1167 combine dual 3-state differential line drivers and 3-state differential line
receivers, both of which operate from a single 5-V power supply. The driver and receiver have active-high and
active-low enables, respectively, which can be connected together externally to function as direction control. The
SN65C1168 and SN75C1168 drivers have individual active-high enables.
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1993–2009, Texas Instruments Incorporated