SN74SSTUB32864 Datasheet, PDF (1/18 Pages) Texas Instruments – 25-BIT CONFIGURABLE REGISTERED BUFFER

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SN74SSTUB32864
SCAS791A – OCTOBER 2006 – REVISED SEPTEMBER 2007
25-BIT CONFIGURABLE REGISTERED BUFFER
FEATURES
1
•2 Member of the Texas Instruments Widebus+™
Family
• Pinout Optimizes DDR2 DIMM PCB Layout
• Configurable as 25-Bit 1:1 or 14-Bit 1:2
Registered Buffer
• Chip-Select Inputs Gate the Data Outputs from
Changing State and Minimizes System Power
Consumption
• Output Edge-Control Circuitry Minimizes
Switching Noise in an Unterminated Line
• Supports SSTL_18 Data Inputs
• Differential Clock (CLK and CLK) Inputs
• Supports LVCMOS Switching Levels on the
Control and RESET Inputs
• Supports Industrial Temperature Range
(-40°C to 85°C)
• RESET Input Disables Differential Input
Receivers, Resets All Registers, and Forces
All Outputs Low
DESCRIPTION
This 25-bit 1:1 or 14-bit 1:2 configurable registered buffer is designed for 1.7-V to 1.9-V VCC operation. In the
1:1 pinout configuration, only one device per DIMM is required to drive nine SDRAM loads. In the 1:2 pinout
configuration, two devices per DIMM are required to drive 18 SDRAM loads.
All inputs are SSTL_18, except the reset (RESET) and control (Cn) inputs, which are LVCMOS. All outputs are
edge-controlled circuits optimized for unterminated DIMM loads and meet SSTL_18 specifications.
The SN74SSTUB32864 operates from a differential clock (CLK and CLK). Data are registered at the crossing of
CLK going high and CLK going low.
The C0 input controls the pinout configuration of the 1:2 pinout from register-A configuration (when low) to
register-B configuration (when high). The C1 input controls the pinout configuration from 25-bit 1:1 (when low) to
14-bit 1:2 (when high). C0 and C1 should not be switched during normal operation. They should be hard-wired to
a valid low or high level to configure the register in the desired mode. In the 25-bit 1:1 pinout configuration, the
A6, D6, and H6 terminals are driven low and are do-not-use (DNU) pins.
In the DDR2 RDIMM application, RESET is specified to be completely asynchronous with respect to CLK and
CLK. Therefore, no timing relationship can be ensured between the two. When entering reset, the register is
cleared, and the data outputs are driven low quickly, relative to the time required to disable the differential input
receivers. However, when coming out of reset, the register becomes active quickly, relative to the time required
to enable the differential input receivers. As long as the data inputs are low, and the clock is stable during the
time from the low-to-high transition of RESET until the input receivers are fully enabled, the design of the
SN74SSTUB32864 ensures that the outputs remain low, thus ensuring there will be no glitches on the output.
To ensure defined outputs from the register before a stable clock has been supplied, RESET must be held in the
low state during power up.
The device supports low-power standby operation. When RESET is low, the differential input receivers are
disabled, and undriven (floating) data, clock, and reference voltage (V_REF) inputs are allowed. In addition, when
RESET is low, all registers are reset and all outputs are forced low, except QERR. The LVCMOS RESET and Cn
inputs always must be held at a valid logic high or low level.
T_A
-40°C to 85°C
ORDERING INFORMATION
PACKAGE ⁽¹⁾
ORDERABLE PART NUMBER
LFBGA–ZKE
Tape and reel
SN74SSTUB32864ZKER
TOP-SIDE MARKING
SB864
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+ is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2007, Texas Instruments Incorporated