SN74LVTH16373-EP_16 Datasheet, PDF (1/24 Pages) Texas Instruments – SN74LVTH16373-EP 3.3-V ABT 16-Bit Transparent D-Type Latch With Tri-State Outputs

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SN74LVTH16373-EP
SCBS778B – NOVEMBER 2003 – REVISED JUNE 2016
SN74LVTH16373-EP 3.3-V ABT 16-Bit Transparent D-Type Latch With Tri-State Outputs
1 Features
•1 Controlled Baseline
– One Assembly/Test Site, One Fabrication Site
• Enhanced Diminishing Manufacturing Sources
(DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree ⁽¹⁾
• Member of the Texas Instruments Widebus™
Family
• State-of-the-Art Advanced BiCMOS Technology
(ABT) Design for 3.3-V Operation and Low Static-
Power Dissipation
• Supports Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V_CC)
• Supports Unregulated Battery Operation Down to
2.7 V
• Typical V_OLP (Output Ground Bounce) < 0.8 V at
V_CC = 3.3 V, T_A = 25°C
• I_off and Power-Up Tri-State Support Hot Insertion
• Bus Hold on Data Inputs Eliminates the Need for
External Pullup/Pulldown Resistors
• Distributed V_CC and GND Pins Minimize High-
Speed Switching Noise
• Flow-Through Architecture Optimizes PCB Layout
• Latch-Up Performance Exceeds 500 mA Per
JESD 17
• ESD Protection Exceeds JESD 22
– 4000-V Human Body Model (A114-A)
– 200-V Machine Model (A115-A)
2 Applications
• Data Buffer
• Bus Driver
• Display Driver
3 Description
The SN74LVTH16373 is a 16-bit transparent D-type
latch with tri-state outputs designed for low-voltage
(3.3 V) V_CC operation, but with the capability to
provide a TTL interface to a 5-V system environment.
This device is particularly suitable for implementing
buffer registers, I/O ports, bidirectional bus drivers,
and working registers. This device can be used as
two 8-bit latches or one 16-bit latch. When the latch-
enable (LE) input is high, the Q outputs follow the
data (D) inputs. When LE is taken low, the Q outputs
are latched at the levels set up at the D inputs.
Device Information⁽²⁾
PART NUMBER
PACKAGE
BODY SIZE (NOM)
TSSOP (48)
12.50 mm × 6.10 mm
SN74LVTH16373-EP
SSOP (48)
BGA MICROSTAR
JUNIOR (56)
15.88 mm × 7.49 mm
4.50 mm × 7.00 mm
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
(2) For all available packages, see the orderable addendum at
the end of the data sheet.
SN74LVTH16373-EP Single Channel Block Diagram
1
1OE
48
1LE
C1
47
1D1
1D
2
1Q1
To Seven Other Channels
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.