SN74LVT182502 Datasheet, PDF (1/36 Pages) Texas Instruments – 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

SN74LVT18502, SN74LVT182502
3.3ĆV ABT SCAN TEST DEVICES
WITH 18ĆBIT UNIVERSAL BUS TRANSCEIVERS
SCBS162F − AUGUST 1993 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE  Family of Testability Products
D Members of the Texas Instruments
Widebus  Family
D State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V_CC)
D Support Unregulated Battery Operation
Down to 2.7 V
D UBT  (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus-Hold Data Inputs Eliminate the Need
for External Pullup Resistors
D B-Port Outputs of SN74LVT182502 Devices
Have Equivalent 25-Ω Series Resistors, So
No External Resistors Are Required
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
D SCOPE  Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Device Identification
− Even-Parity Opcodes
D Packaged in 64-Pin Plastic Thin Quad Flat
Packages Using 0.5-mm Center-to-Center
Spacings
SN74LVT18502, SN74LVT182502 . . . PM PACKAGE
(TOP VIEW)
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
V_CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
1B4
1B5
1B6
GND
1B7
1B8
1B9
V_CC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1996, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
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