SN74LVC2G66_14 Datasheet, PDF (1/23 Pages) Texas Instruments – SN74LVC2G66 Dual Bilateral Analog Switch

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SN74LVC2G66
SCES325K – JULY 2001 – REVISED JANUARY 2014
SN74LVC2G66 Dual Bilateral Analog Switch
Check for Samples: SN74LVC2G66
FEATURES
1
•2 Available in the Texas Instruments
NanoFree™ Package
• 1.65-V to 5.5-V V_CC Operation
• Inputs Accept Voltages to 5.5 V
• Max t_pd of 0.8 ns at 3.3 V
• High On-Off Output Voltage Ratio
• High Degree of Linearity
• High Speed, Typically 0.5 ns
(V_CC = 3 V, C_L = 50 pF)
• Rail-to-Rail Input/Output
• Low On-State Resistance, Typically ≉6 Ω
(V_CC = 4.5 V)
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
DESCRIPTION
This dual bilateral analog switch is designed for
1.65-V to 5.5-V V_CC operation.
The SN74LVC2G66 device can handle both analog
and digital signals. The SN74LVC2G66 device
permits signals with amplitudes of up to 5.5 V (peak)
to be transmitted in either direction.
NanoFree™ package technology is a major
breakthrough in IC packaging concepts, using the die
as the package.
Each switch section has its own enable-input control
(C). A high-level voltage applied to C turns on the
associated switch section.
Applications include signal gating, chopping,
modulation or demodulation (modem), and signal
multiplexing for analog-to-digital and digital-to-analog
conversion systems.
DCT PACKAGE
(TOP VIEW)
1A
1
1B
2
2C
3
8
V_CC
7
1C
6
2B
DCU PACKAGE
(TOP VIEW)
1A 1
1B 2
2C 3
GND 4
8
V_CC
7 1C
6 2B
5 2A
YZP PACKAGE
(BOTTOM VIEW)
GND 4 ⁵ 2A
2C 3 6 2B
1B 2 7 1C
1A
18
V_CC
GND
4
5
2A
See mechanical drawings for dimensions.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2001–2014, Texas Instruments Incorporated