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SN74LVC1G38_16 Datasheet, PDF (1/21 Pages) Texas Instruments – Single 2-Input NAND Gate With Open-Drain Output
SN74LVC1G38
www.ti.com
SCES538D – JANUARY 2004 – REVISED DECEMBER 2013
Single 2-Input NAND Gate With Open-Drain Output
Check for Samples: SN74LVC1G38
FEATURES
1
•2 Available in the Texas Instruments NanoStar™
and NanoFree™ Packages
• Supports 5-V VCC Operation
• Inputs Accept Voltages to 5.5 V
• Supports Down Translation to VCC
• Max tpd of 4.5 ns at 3.3 V
• Low Power Consumption, 10-µA Max ICC
• ±24-mA Output Drive at 3.3 V
• Ioff Supports Live Insertion, Partial-Power-
Down Mode, and Back-Drive Protection
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DESCRIPTION
The SN74LVC1G38 device is designed for 1.65-V to
5.5-V VCC operation.
This device is a single two-input NAND buffer gate
with open-drain output. It performs the Boolean
function Y = A • B or Y = A + B in positive logic.
This device is fully specified for partial-power-down
applications using Ioff. The Ioff circuitry disables the
outputs, preventing damaging current backflow
through the device when it is powered down.
NanoStar™ and NanoFree™ package technology is
a major breakthrough in IC packaging concepts,
using the die as the package.
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
YEP OR YZP PACKAGE
(BOTTOM VIEW)
A
1
B
2
5
VCC
A
1
5
VCC GND 3 4 Y
B2
B
2
A 1 5 VCC
GND
3
4Y
GND
3
4
Y
DRY PACKAGE
(TOP VIEW)
A1
B2
GND 3
6 VCC
5 NC
4Y
NC – No internal connection
See mechanical drawings for dimensions.
DSF PACKAGE
(TOP VIEW)
A1
B2
GND 3
6 VCC
5 NC
4Y
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2013, Texas Instruments Incorporated