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SN74LVC1G3157_14 Datasheet, PDF (1/30 Pages) Texas Instruments – SINGLE-POLE DOUBLE-THROW ANALOG SWITCH
SN74LVC1G3157
www.ti.com
SCES424H – JANUARY 2003 – REVISED MAY 2012
SINGLE-POLE DOUBLE-THROW ANALOG SWITCH
Check for Samples: SN74LVC1G3157
FEATURES
1
•2 1.65-V to 5.5-V VCC Operation
• Useful for Both Analog and Digital
Applications
• Specified Break-Before-Make Switching
• Rail-to-Rail Signal Handling
• High Degree of Linearity
• High Speed, Typically 0.5 ns
(VCC = 3 V, CL = 50 pF)
• Low On-State Resistance, Typically ≉6 Ω
(VCC = 4.5 V)
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
DRL PACKAGE
(TOP VIEW)
B2
1
GND
2
6
S
B2
1
6S
B2 1 6 S
GND
2
5
VCC GND 2
5 VCC
5
VCC
B1
3
4A
B1 3 4 A
B1
3
4
A
DRY PACKAGE
(TOP VIEW)
B2 1
GND 2
B1 3
6S
5 VCC
4A
DSF PACKAGE
(TOP VIEW)
B2 1 6 S
GND 2 5 VCC
B1 3 4 A
YZP PACKAGE
(BOTTOM VIEW)
B1 C1 3 4 C2 A
GND B1 2 5 B2 VCC
B2 A1 1 6 A2 S
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This single-pole double-throw (SPDT) analog switch is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC1G3157 can handle both analog and digital signals. The device permits signals with amplitudes of
up to VCC (peak) to be transmitted in either direction.
Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for
analog-to-digital and digital-to-analog conversion systems.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2012, Texas Instruments Incorporated