SN74LVC1G07-Q1_17 Datasheet, PDF (1/12 Pages) Texas Instruments – SINGLE BUFFER/DRIVER WITH OPEN-DRAIN OUTPUT

SN74LVC1G07-Q1
www.ti.com
SINGLE BUFFER/DRIVER WITH OPEN-DRAIN OUTPUT
Check for Samples: SN74LVC1G07-Q1
SCES826 – MARCH 2011
FEATURES
1
• Qualified for Automotive Applications
• Supports 5-V V_CC Operation
• Input and Open-Drain Output Accept
Voltages up to 5.5 V
• Max t_pd of 5.7 ns at 3.3 V
• Low Power Consumption, 10-μA Max I_CC
• ±24-mA Output Drive at 3.3 V
• I_off Supports Partial-Power-Down Mode
Operation
N.C.
A
DBV PACKAGE
(TOP VIEW)
1
5
V_CC
2
GND
3
4
Y
N.C. – No internal connection
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This single buffer/driver is designed for 1.65-V to 5.5-V V_CC operation.
The output of the SN74LVC1G07-Q1 device is open drain and can be connected to other open-drain outputs to
implement active-low wired-OR or active-high wired-AND functions. The maximum sink current is 32 mA.
This device is fully specified for partial-power-down applications using I_off.The I_off circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION
T_A
PACKAGE^{(1) (2)}
ORDERABLE
PART NUMBER
–40°C to 125°C SOT (SOT-23) – DBV
Reel of 3000 SN74LVC1G07QDBVRQ1
TOP-SIDE
MARKING
CCQO
(1) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
FUNCTION TABLE
INPUT
A
OUTPUT
Y
L
L
H
Z
LOGIC DIAGRAM (POSITIVE LOGIC)
A2
4Y
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated