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SN74LV32A-Q1 Datasheet, PDF (1/10 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-OR GATE
SN74LV32A-Q1
QUADRUPLE 2-INPUT POSITIVE-OR GATE
D Qualified for Automotive Applications
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D 2-V to 5.5-V VCC Operation
D Max tpd of 6.5 ns at 5 V
D Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C
D Typical VOHV (Output VOH Undershoot)
>2.3 V at VCC = 3.3 V, TA = 25°C
D Supports Mixed-Mode Voltage Operation on
All Ports
D Ioff Supports Partial-Power-Down Mode
Operation
SCLS516C − JULY 2003 − REVISED FEBRUARY 2008
PW PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
description/ordering information
These quadruple 2-input positive-OR gates are designed for 2-V to 5.5-V VCC operation.
The SN74LV32A performs the Boolean function Y + A ) B or Y + A • B in positive logic.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION†
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 105°C TSSOP − PW Tape and reel SN74LV32ATPWRQ1 LV32AT
† For the most current package and ordering information, see the Package Option Addendum at the end
of this document, or see the TI web site at http://www.ti.com.
‡ Package drawings, thermal data, and symbolization are available at http://www.ti.com/packaging.
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
X
H
X
H
H
L
L
L
logic diagram, each gate (positive logic)
A
Y
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2008, Texas Instruments Incorporated
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