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SN74LV08A-Q1 Datasheet, PDF (1/10 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-AND GATE
SN74LV08A-Q1
QUADRUPLE 2-INPUT POSITIVE-AND GATE
D Qualified for Automotive Applications
D Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C
D Typical VOHV (Output VOH Undershoot)
>2.3 V at VCC = 3.3 V, TA = 25°C
D Supports Mixed-Mode Voltage Operation on
All Ports
D Ioff Supports Partial-Power-Down Mode
Operation
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D ESD Protection Exceeds JESD 22
− 2000-V Human-Body Model (A114-A)
− 200-V Machine Model (A115-A)
− 1000-V Charged-Device Model (C101)
SCLS465C − FEBRUARY 2003 − REVISED JANUARY 2008
PW PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
description/ordering information
This quadruple 2-input positive-AND gate is designed for 2-V to 5.5-V VCC operation.
The SN74LV08A performs the Boolean function Y + A • B or Y + A ) B in positive logic.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION†
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 105°C TSSOP − PW Tape and reel SN74LV08ATPWRQ1 LV08ATQ
† For the most current package and ordering information, see the Package Option Addendum at the end
of this document, or see the TI web site at http://www.ti.com.
‡ Package drawings, thermal data, and symbolization are available at http://www.ti.com/packaging.
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
H
H
L
X
L
X
L
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2008, Texas Instruments Incorporated
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