SN74HC10-EP Datasheet, PDF (1/11 Pages) Texas Instruments – TRIPLE 3-INPUT POSITIVE-NAND GATE

SN74HC10ĆEP
TRIPLE 3ĆINPUT POSITIVEĆNAND GATE
D Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D Extended Temperature Performance of
−40°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree^†
D Wide Operating Voltage Range of 2 V to 6 V
† _{Component qualification in accordance with JEDEC and industry}
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SCLS558 − JANUARY 2004
D Outputs Can Drive Up To 10 LSTTL Loads
D Low Power Consumption, 20-µA Max I_CC
D Typical t_pd = 9 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
D OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
2A 3
2B 4
2C 5
2Y 6
GND 7
14 V_CC
13 1C
12 1Y
11 3C
10 3B
9 3A
8 3Y
description/ordering information
The SN74HC10 device contains three independent 3-input NAND gates. It performs the Boolean function
Y = A • B • C or Y = A + B + C in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
SOIC − D
−40°C to 125°C
TSSOP − PW
Tape and reel
Tape and reel
SN74HC10QDREP
SN74HC10QPWREP
SHC10EP
SHC10EP
‡ _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are}
available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
A
B
C
OUTPUT
Y
H
H
H
L
L
X
X
H
X
L
X
H
X
X
L
H
logic diagram (positive logic)
A
B
Y
C
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2004, Texas Instruments Incorporated
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