SN74BCT8373 Datasheet, PDF (1/21 Pages) Texas Instruments – SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES

• Member of the Texas Instruments SCOPE 
Family of Testability Products
• Octal Test-Integrated Circuit
• Functionally Equivalent to SN74F373 and
SN74BCT373 in the Normal-Function Mode
• Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
• Test Operation Synchronous to Test
Access Port (TAP)
• Implements Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
• SCOPE  Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/ Toggle Outputs
• Package Options Include Plastic
Small-Outline (DW) Packages and
Standard Plastic 300-mil DIPs (NT)
SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DĆTYPE LATCHES
SCBS471 − JUNE 1990 − REVISED JUNE 1994
DW OR NT PACKAGE
(TOP VIEW)
LE 1
1Q 2
2Q 3
3Q 4
4Q 5
GND 6
5Q 7
6Q 8
7Q 9
8Q 10
TDO 11
TMS 12
24 OE
23 1D
22 2D
21 3D
20 4D
19 5D
18 V_CC
17 6D
16 7D
15 8D
14 TDI
13 TCK
description
The SN74BCT8373 scan test device with octal D-type latches is a member of the Texas Instruments SCOPE
testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan
to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via
the 4-wire test access port (TAP) interface.
In the normal mode, this device is functionally equivalent to the SN74F373 and SN74BCT373 octal D-type
latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the
device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal latches.
In the test mode, the normal operation of the SCOPE octal latches is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output
(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN74BCT8373 is characterized for operation from 0°C to 70°C.
SCOPE is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1994, Texas Instruments Incorporated
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• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
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