SN74BCT29828B Datasheet, PDF (1/4 Pages) Texas Instruments – 10-BIT BUFFERS /DRIVERS WITH 3-STATE OUTPUTS

• State-of-the-Art BiCMOS Design
Significantly Reduces I_CCZ
• ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015; Exceeds
200 V Using Machine Model (C = 200 pF,
R = 0)
• 3-State Inverting Outputs Drive Bus Lines or
Buffer Memory Address Registers
• P-N-P Inputs Reduce dc Loading
• Flow-Through Architecture Optimizes
PCB Layout
• Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic Chip
Carriers (FK) and Flatpacks (W), and
Standard Plastic and Ceramic 300-mil DIPs
(JT, NT)
description
These 10-bit buffers and bus drivers provide
high-performance bus interface for wide data
paths or buses carrying parity.
The 3-state control gate is a 2-input AND gate with
active-low inputs so that if either output-enable
(OE1 or OE2) input is high, all ten outputs are in
the high-impedance state. The outputs are also in
the high-impedance state during power-up and
power-down conditions. The outputs remain in the
high-impedance state while the device is powered
down.
The SN54BCT29828B is characterized for
operation over the full military temperature range
of − 55°C to 125°C. The SN74BCT29828B is
characterized for operation from 0°C to 70°C.
SN54BCT29828B, SN74BCT29828B
10ĆBIT BUFFERS/DRIVERS
WITH 3ĆSTATE OUTPUTS
SCBS080B − DECEMBER 1990 − REVISED NOVEMBER 1993
SN54BCT29828B . . . JT OR W PACKAGE
SN74BCT29828B . . . DW OR NT PACKAGE
(TOP VIEW)
OE1 1
A1 2
A2 3
A3 4
A4 5
A5 6
A6 7
A7 8
A8 9
A9 10
A10 11
GND 12
24 V_CC
23 Y1
22 Y2
21 Y3
20 Y4
19 Y5
18 Y6
17 Y7
16 Y8
15 Y9
14 Y10
13 OE2
SN54BCT29828B . . . FK PACKAGE
(TOP VIEW)
4 3 2 1 28 27 26
A3 ⁵
25 Y3
A4 ⁶
24 Y4
A5 ⁷
23 Y5
NC ⁸
22 NC
A6 ⁹
21 Y6
A7 ¹⁰
20 Y7
A8 ¹¹
19 Y8
12 13 14 15 16 17 18
NC − No internal connection
FUNCTION TABLE
INPUTS
OE1 OE2 A
OUTPUT
Y
L
L
L
H
L
L
H
L
H
X
X
Z
X
H
X
Z
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1993, Texas Instruments Incorporated
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