SN74BCT2952 Datasheet, PDF (1/6 Pages) Texas Instruments – OCTAL BUS TRANSCEIVER AND REGISTER WITH 3-STATE OUTPUTS

• State-of-the-Art BiCMOS Design
Significantly Reduces I_CCZ
• ESD Protection Exceeds 2000 V
Per MIL-STD-883C, Method 3015
• Two 8-Bit, Back-to-Back Registers Store
Data Flowing in Both Directions
• A Port Sinks 24 mA and Sources 3 mA
• B Port Sinks 64 mA and Sources 15 mA
• Noninverting Outputs
• Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic 300-mil DIPs (NT)
description
SN74BCT2952
OCTAL BUS TRANSCEIVER AND REGISTER
WITH 3ĆSTATE OUTPUTS
SCBS063A − FEBRUARY 1991 − REVISED NOVEMBER 1993
DW OR NT PACKAGE
(TOP VIEW)
B8 1
B7 2
B6 3
B5 4
B4 5
B3 6
B2 7
B1 8
OEAB 9
CLKAB 10
CLKENAB 11
GND 12
24 V_CC
23 A8
22 A7
21 A6
20 A5
19 A4
18 A3
17 A2
16 A1
15 OEBA
14 CLKBA
13 CLKENBA
The SN74BCT2952 consists of two 8-bit back-to-back registers that store data flowing in both directions
between two bidirectional buses. Data on the A or B bus is stored in the registers on the low-to-high transition
of the clock (CLKAB or CLKBA) input provided that the clock-enable (CLKENAB or CLKENBA) input is low.
Taking the output-enable (OEAB or OEBA) input low accesses the data on either port.
The SN74BCT2952 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE†
INPUTS
OUTPUT
CLKENAB CLKAB OEAB A
B
H
X
L
X
B0‡
X
H or L
L
X
B0‡
L
↑
L
L
L
L
↑
L
H
H
X
X
H
X
Z
† _{A-to-B data flow is shown; B-to-A data flow is similar}
but uses CLKENBA, CLKBA, and OEBA.
‡ _{Level of B before the indicated steady-state input}
conditions were established.
logic symbol^§
15
OEBA
13
CLKENBA
14
CLKBA
9
OEAB ₁₁
CLKENAB
10
CLKAB
16
A1
17
A2
18
A3
19
A4
20
A5
21
A6
22
A7
23
A8
EN3
G1
1 C5
EN4
G2
2 C6
3 1 5D
6D
14
8
B1
7
B2
6
B3
5
B4
4
B5
3
B6
2
B7
1
B8
§ _{This symbol is in accordance with ANSI/IEEE Std 91-1984 and}
IEC Publication 617-12.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1993, Texas Instruments Incorporated
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• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
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