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SN74AS195_08 Datasheet, PDF (1/9 Pages) Texas Instruments – 4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER
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SN74AS195
4ĆBIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER
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SDAS138B − DECEMBER 1983 − REVISED JANUARY 1995
• Parallel-to-Serial, Serial-to-Parallel
Conversions
• Parallel Synchronous Loading
• J and K Inputs to First Stage
• Right Shift Only With Complementary
Outputs on Last Stage
• Direct Overriding Clear
• Package Options Include Plastic
Small-Outline (D) Packages and Standard
Plastic (N) 300-mil DIPs
D OR N PACKAGE
(TOP VIEW)
CLR 1
J2
K3
A4
B5
C6
D7
GND 8
16 VCC
15 QA
14 QB
13 QC
12 QD
11 QD
10 CLK
9 SH/LD
description
This 4-bit bidirectional universal shift register features parallel (A, B, C, D) inputs, parallel (QA, QB, QC, QD, QD)
outputs, J-K serial (J, K) inputs, shift/load control (SH/LD) input, and a direct overriding clear (CLR). The
registers have two modes of operation:
• Parallel (broadside) load
• Shift (in the direction QA toward QD)
Parallel loading is accomplished by applying the four bits of data and taking SH/LD low. The data is loaded into
the associated flip-flops and appears at the outputs after the positive transition of the clock (CLK) input. During
loading, serial data flow is inhibited.
Shifting is accomplished synchronously when SH/LD is high. Serial data for this mode is entered at the J-K
inputs. These inputs permit the first stage to perform as a J-K, D-, or T-type flip-flop as shown in the function
table.
The SN74AS195 is characterized for operation from 0°C to 70°C.
CLR SH/LD CLK
L
X
X
H
L
↑
H
H
L
H
H
↑
H
H
↑
H
H
↑
H
H
↑
INPUTS
SERIAL
J
K
X
X
X
X
X
X
L
H
L
L
H
H
H
L
FUNCTION TABLE
PARALLEL
A
B
C
D
X
X
X
X
a
b
c
d
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
OUTPUTS
QA
L
a
QA0
QA0
L
H
QAN
QB
L
b
QB0
QA0
QAn
QAn
QAn
QC
L
c
QC0
QBn
QBn
QBn
QBn
QD
L
d
QD0
QCn
QCn
QCn
QCn
QD
H
d
QD0
QCn
QCn
QCn
QCn
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1995, Texas Instruments Incorporated
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