SN74AS1008A_14 Datasheet, PDF (1/9 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-AND BUFFER/DRIVER

SN74AS1008A
QUADRUPLE 2-INPUT POSITIVE-AND BUFFER/DRIVER
• Driver Version of ′AS08
• Offers High Capacitive-Drive Capability
• Package Options Include Plastic
Small-Outline (D) Packages and Standard
Plastic (N) 300-mil DIPs
description
This device contains four independent 2-input
positive-AND buffers/drivers. It performs the
Boolean functions Y = A • B or Y = A + B in positive
logic.
The SN74AS1008A is characterized for operation
from 0°C to 70°C.
SDAS071B – DECEMBER 1982 – REVISED JANUARY 1995
D OR N PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 V_CC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
H
H
L
X
L
X
L
L
logic symbol^†
1
1A
&
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
3
1Y
6
2Y
8
3Y
11
4Y
† _{This symbol is in accordance with ANSI/IEEE Std 91-1984 and}
IEC Publication 617-12.
logic diagram (positive logic)
1A ¹
1B ²
2A ⁴
2B ⁵
9
3A
3B ¹⁰
4A ¹²
4B ¹³
3 _1Y
6
2Y
8
3Y
11 _4Y
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)^‡
Supply voltage, V_CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Input voltage, V_I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Operating free-air temperature range, T_A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
‡ _{Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and}
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1995, Texas Instruments Incorporated
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