English
Language : 

SN74ALVC126_15 Datasheet, PDF (1/15 Pages) Texas Instruments – QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS
www.ti.com
FEATURES
• Operates From 1.65 V to 3.6 V
• Max tpd of 3.1 ns at 3.3 V
• ±24-mA Output Drive at 3.3 V
• Latch-Up Performance Exceeds 250 mA Per
JESD 17
• ESD Performance Tested Per JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
SN74ALVC126
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCES111J – JULY 1997 – REVISED OCTOBER 2004
D, DGV, NS, OR PW PACKAGE
(TOP VIEW)
1OE 1
1A 2
1Y 3
2OE 4
2A 5
2Y 6
GND 7
14 VCC
13 4OE
12 4A
11 4Y
10 3OE
9 3A
8 3Y
DESCRIPTION/ORDERING INFORMATION
This quadruple bus buffer gate is designed for 1.65-V to 3.6-V VCC operation.
The SN74ALVC126 features independent line drivers with 3-state outputs. Each output is disabled when the
associated output-enable (OE) input is low.
To ensure the high-impedance state during power up or power down, OE should be tied to GND through a
pulldown resistor; the minimum value of the resistor is determined by the current-sourcing capability of the driver.
TA
-40°C to 85°C
ORDERING INFORMATION
PACKAGE (1)
ORDERABLE PART NUMBER
SOIC – D
Tube
Tape and reel
SN74ALVC126D
SN74ALVC126DR
SOP – NS
Tape and reel
SN74ALVC126NSR
TSSOP – PW
Tape and reel
SN74ALVC126PWR
TVSOP – DGV
Tape and reel
SN74ALVC126DGVR
TOP-SIDE MARKING
ALVC126
ALVC126
VA126
VA126
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
FUNCTION TABLE
(each buffer)
INPUTS
OE
A
H
H
H
L
L
X
OUTPUT
Y
H
L
Z
1OE 1
2
1A
LOGIC DIAGRAM (POSITIVE LOGIC)
3OE 10
3
1Y
9
3A
8
3Y
2OE 4
5
2A
6
2Y
4OE 13
12
4A
11
4Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1997–2004, Texas Instruments Incorporated