SN74ALVC125_15 Datasheet, PDF (1/15 Pages) Texas Instruments – QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS

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FEATURES
• Operates from 1.65 V to 3.6 V
• Max t_pd of 2.8 ns at 3.3 V
• ±24-mA Output Drive at 3.3 V
• Latch-up Performance Exceeds 250 mA Per
JESD 17
• ESD Performance Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
SN74ALVC125
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCES110H – JULY 1997 – REVISED SEPTEMBER 2004
D, DGV, NS, OR PW PACKAGE
(TOP VIEW)
1OE 1
1A 2
1Y 3
2OE 4
2A 5
2Y 6
GND 7
14 V_CC
13 4OE
12 4A
11 4Y
10 3OE
9 3A
8 3Y
DESCRIPTION/ORDERING INFORMATION
This quadruple bus buffer gate is designed for 1.65-V to 3.6-V V_CC operation.
The SN74ALVC125 features independent line drivers with 3-state outputs. Each output is disabled when the
associated output-enable (OE) input is high.
To ensure the high-impedance state during power up or power down, OE should be tied to V_CC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
T_A
-40°C to 85°C
ORDERING INFORMATION
PACKAGE ⁽¹⁾
ORDERABLE PART NUMBER
SOIC - D
Tube
Tape and reel
SN74ALVC125D
SN74ALVC125DR
SOP - NS
Tape and reel
SN74ALVC125NSR
TSSOP - PW
Tube
Tape and reel
SN74ALVC125PW
SN74ALVC125PWR
TVSOP - DGV
Tape and reel
SN74ALVC125DGVR
TOP-SIDE MARKING
ALVC125
ALVC125
VA125
VA125
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
FUNCTION TABLE
(each buffer)
INPUTS
OE
A
L
H
L
L
H
X
OUTPUT
Y
H
L
Z
1
1OE
1A ²
LOGIC DIAGRAM (POSITIVE LOGIC)
10
3OE
3 _1Y
3A ⁹
8 _3Y
4
2OE
2A ⁵
6 _2Y
13
4OE
4A ¹²
11 _4Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1997–2004, Texas Instruments Incorporated