SN74ALVC00-EP Datasheet, PDF (1/9 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NAND GATE

SN74ALVC00ĆEP
QUADRUPLE 2ĆINPUT POSITIVEĆNAND GATE
D Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree^†
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
† _{Component qualification in accordance with JEDEC and industry}
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SCES521A − DECEMBER 2003 − REVISED MAY 2004
D Operates From 1.65 V to 3.6 V
D Max t_pd of 3 ns at 3.3 V
D ±24-mA Output Drive at 3.3 V
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D OR PW PACKAGE
(TOP VIEW)
1A ¹
1B ²
1Y ³
2A ⁴
2B ⁵
2Y ⁶
GND ⁷
14 _VCC
13 _4B
12 _4A
11 _4Y
10 _3B
9 _3A
8 _3Y
description/ordering informatiom
The SN74ALVC00 quadruple 2-input positive-NAND gate is designed for 1.65-V to 3.6-V V_CC operation.
The device performs the Boolean function Y = A • B or Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 85°C
SOIC − D
TSSOP − PW
Tape and reel
Tape and reel
SN74ALVC00IDREP
ALVC00IEP
SN74ALVC00IPWREP§ ALVC00E
‡ _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines}
are available at www.ti.com/sc/package.
§ _{Product Preview}
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
H
L
L
X
H
X
L
H
logic diagram, each gate (positive logic)
A
Y
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2004, Texas Instruments Incorporated
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