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SN74AHCT240-Q1 Datasheet, PDF (1/9 Pages) Texas Instruments – OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS
SN74AHCT240ĆQ1
OCTAL BUFFER/DRIVER
WITH 3ĆSTATE OUTPUTS
SCLS582B − APRIL 2004 − REVISED APRIL 2008
D Qualified for Automotive Applications
D Inputs Are TTL-Voltage Compatible
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
description/ordering information
This octal buffer/driver is designed specifically to
improve the performance and density of 3-state
memory-address drivers, clock drivers, and
bus-oriented receivers and transmitters.
The SN74AHCT240 device is organized as two 4-bit
buffers/line drivers with separate output-enable (OE)
inputs. When OE is low, the device passes data from
the A inputs to the Y outputs. When OE is high, the
outputs are in the high-impedance state.
PW PACKAGE
(TOP VIEW)
1OE 1
1A1 2
2Y4 3
1A2 4
2Y3 5
1A3 6
2Y2 7
1A4 8
2Y1 9
GND 10
20 VCC
19 2OE
18 1Y1
17 2A4
16 1Y2
15 2A3
14 1Y3
13 2A2
12 1Y4
11 2A1
To ensure the high-impedance state during power up or power down, OE shall be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMATION{
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 85°C
TSSOP − PW
Tape and reel SN74AHCT240IPWRQ1 AHCT240I
† For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI web site at http://www.ti.com.
‡ Package drawings, thermal data, and symbolization are available at http://www.ti.com/packaging.
FUNCTION TABLE
(each 4-bit buffer/driver)
INPUTS
OE
A
OUTPUT
Y
L
H
L
L
L
H
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2008, Texas Instruments Incorporated
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