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SN74AHCT1G126-Q1 Datasheet, PDF (1/10 Pages) Texas Instruments – SINGLE BUS BUFFER GATE WITH 3-STATE OUTPUT
D Qualified for Automotive Applications
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0),
1000-V Charged-Device Model
D Operating Range of 3 V to 5.5 V
D Max tpd of 6 ns at 5 V
D Low Power Consumption, 10-µA Max ICC
D ±8-mA Output Drive at 5 V
D Inputs Are TTL-Voltage Compatible
SN74AHCT1G126-Q1
SINGLE BUS BUFFER GATE
WITH 3-STATE OUTPUT
SCLS505B − JUNE 2003 − REVISED FEBRUARY 2008
DCK PACKAGE
(TOP VIEW)
OE 1
A2
GND 3
5 VCC
4Y
description/ordering information
The SN74AHCT1G126 is a single bus buffer gate/line driver with 3-state output. The output is disabled when
the output-enable (OE) input is low. When OE is high, true data is passed from the A input to the Y output.
To ensure the high-impedance state during power up or power down, OE should be tied to GND through a
pulldown resistor; the minimum value of the resistor is determined by the current-sourcing capability of the
driver.
ORDERING INFORMATION†
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING§
−40°C to 125°C SOT (SC-70) − DCK
Reel of 3000
CAHCT1G126QDCKRQ1 BN_
† For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI web site at http://www.ti.com.
‡ Package drawings, thermal data, and symbolization are available at http://www.ti.com/packaging.
§ The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
INPUTS
OE
A
OUTPUT
Y
H
H
H
H
L
L
L
X
Z
logic diagram (positive logic)
1
OE
A2
4Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2008, Texas Instruments Incorporated
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