SN74ACT08-EP Datasheet, PDF (1/9 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-AND GATE

SN74ACT08ĆEP
QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE
D Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree^†
D 4.5-V to 5.5-V V_CC Operation
† _{Component qualification in accordance with JEDEC and industry}
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SCAS779 − SEPTEMBER 2004
D Inputs Accept Voltages to 5.5 V
D Max t_pd of 10 ns at 5 V
D Inputs Are TTL-Voltage Compatible
D PACKAGE
(TOP VIEW)
1A ¹
1B ²
1Y ³
2A ⁴
2B ⁵
2Y ⁶
GND ⁷
14 _VCC
13 _4B
12 _4A
11 _4Y
10 _3B
9 _3A
8 _3Y
description/ordering information
The SN74ACT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean functions
Y = A  B or Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 85°C
SOIC − D
Tape and reel SN74ACT08IDREP SACT08IEP
‡ _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are}
available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
H
H
L
X
L
X
L
L
logic diagram, each gate (positive logic)
A
Y
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2004, Texas Instruments Incorporated
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