SN74AC32-EP Datasheet, PDF (1/8 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-OR GATE

SN74AC32ĆEP
QUADRUPLE 2ĆINPUT POSITIVEĆOR GATE
D Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D Extended Temperature Performance of
−55°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree^†
† _{Component qualification in accordance with JEDEC and industry}
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SCAS720 − OCTOBER 2003
D 2-V to 6-V V_CC Operation
D Inputs Accept Voltages to 6 V
D Max t_pd of 7.5 ns at 5 V
D PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 V_CC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
description/ordering information
The SN74AC32 is a quadruple 2-input positive-OR gate. The device performs the Boolean function
Y = A + B or Y = A • B in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−55°C to 125°C SOIC − D
Tape and reel SN74AC32MDREP
SAC32MEP
‡ _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are}
available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
X
H
X
H
H
L
L
L
logic diagram, each gate (positive logic)
A
Y
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2003, Texas Instruments Incorporated
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