SN74AC11-EP Datasheet, PDF (1/10 Pages) Texas Instruments – TRIPLE 3-INPUT POSITIVE-AND GATE

SN74AC11ĆEP
TRIPLE 3ĆINPUT POSITIVEĆAND GATE
D Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree^†
† _{Component qualification in accordance with JEDEC and industry}
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SCLS557 − JANUARY 2004
D 2-V to 6-V V_CC Operation
D Inputs Accept Voltages to 6 V
D Max t_pd of 7.5 ns at 5 V
D OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
2A 3
2B 4
2C 5
2Y 6
GND 7
14 V_CC
13 1C
12 1Y
11 3A
10 _3B
9 3C
8 _3Y
description/ordering information
The SN74AC11 device contains three independent 3-input AND gates. This device performs the Boolean
function Y = A • B • C or Y = A + B + C in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 85°C
SOIC − D
TSSOP − PW
Tape and reel
Tape and reel
SN74AC11IDREP§
SN74AC11IPWREP
SAC11EP
SAC11EP
‡ _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are}
available at www.ti.com/sc/package.
§ _{Product Preview}
FUNCTION TABLE
(each gate)
INPUTS
A
B
C
OUTPUT
Y
H
H
H
H
L
X
X
L
X
L
X
L
X
X
L
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2004, Texas Instruments Incorporated
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