SN65MLVD128_08 Datasheet, PDF (1/18 Pages) Texas Instruments – 1:8 LVTTL TO M-LVDS REPEATER DUAL 1:4 LVTTL TO M-LVDS REPEATER

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SN65MLVD128
SN65MLVD129
SLLS586 – MARCH 2004
1:8 LVTTL TO M-LVDS REPEATER DUAL 1:4 LVTTL TO M-LVDS REPEATER
FEATURES
• LVTTL Receiver and Eight Line Drivers
Configured as an 8-Port M-LVDS Repeater –
SN65MLVD128
• 2 LVTTL Receivers and Eight Line Drivers
Configured as Dual 4-Port M-LVDS Repeaters
– SN65MLVD129
• Drivers Meet or Exceed the M-LVDS Standard
(TIA/EIA-899)
• Low-Voltage Differential 30-Ω to 55-Ω Line
Drivers for Data Rates ⁽¹⁾ Up to 250 Mbps or
Clock Frequencies Up to 125 MHz
• Power Up/Down Glitch Free
• Controlled Driver Output Voltage Transition
Times for Improved Signal Quality
(1) The data rate of a line, is the number of voltage transitions
that are made per second expressed in the units bps (bits per
second).
• Bus Pins High Impedance When Disabled or
V_CC ≤ 1.5 V
• Independent Enables for each Driver
• Output-to-Ouput Skew t_sk(o) ≤ 160 ps
Part-to-Part Skew t_sk(pp) ≤ 800 ps
• Single 3.3-V Voltage Supply
• Bus Pin ESD Protection Exceeds 9 kV
• Packaged in 48-Pin TSSOP (DGG)
APPLICATIONS
• AdvancedTCA™ (ATCA™) Clock Bus Driver
• Clock Distribution
• Data and Clock Repeating Over Backplanes
and Cables
• Cellular Base Stations
• Central Office Switches
• Network Switches and Routers
LOGIC DIAGRAM
EN1
EN2
EN3
EN4
1D
EN5
EN6
EN7
EN8
1A
1B
2A
2B
3A
3B
4A
4B
5A
5B
6A
6B
7A
7B
8A
8B
SN65MLVD128
EN1
EN2
1D
EN3
EN4
EN5
EN6
2D
EN7
EN8
1A
1B
2A
2B
3A
3B
4A
4B
5A
5B
6A
6B
7A
7B
8A
8B
SN65MLVD129
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
AdvancedTCA, ATCA are trademarks of PCI Industrial Computer Manufacturers Group.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004, Texas Instruments Incorporated