SN65LVDS33-EP Datasheet, PDF (1/23 Pages) Texas Instruments – HIGH-SPEED DIFFERENTIAL RECEIVER

SN65LVDS33-EP, SN65LVDT33-EP
www.ti.com
SGLS309B – JUNE 2005 – REVISED APRIL 2007
HIGH-SPEED DIFFERENTIAL RECEIVER
FEATURES
• Controlled Baseline – One Assembly/Test
Site, One Fabrication Site
• Extended Temperature Performance of Up to
–55°C to 125°C
• Enhanced Diminishing Manufacturing Sources
(DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree ⁽¹⁾
• 400-Mbps Signaling Rate ⁽²⁾ and 200-Mxfr/s
Data Transfer Rate
• Operates With a Single 3.3-V Supply
• –4 V to 5 V Common-Mode Input Voltage
Range
• Differential Input Thresholds < ±50 mV With
50 mV of Hysteresis Over Entire
Common-Mode Input Voltage Range
• Integrated 110-Ω Line Termination Resistors
On LVDT Products
• Complies With TIA/EIA-644 (LVDS)
• Active Failsafe Assures a High-Level Output
With No Input
• Bus-Pin ESD Protection Exceeds 15-kV HBM
• Input Remains High-Impedance On Power
Down
• TTL Inputs Are 5-V Tolerant
• Pin-Compatible With the AM26LS32,
SN65LVDS32B, µA9637, SN65LVDS9637B
DESCRIPTION
This family of four LVDS data line receivers offers
the widest common-mode input voltage range in the
industry. These receivers provide an input voltage
range specification compatible with a 5-V PECL
signal as well as an overall increased ground-noise
tolerance. They are in industry standard footprints
with integrated termination as an option.
Precise control of the differential input voltage
thresholds allows for inclusion of 50 mV of input
voltage hysteresis to improve noise rejection on
slowly changing input signals. The input thresholds
are still no more than +50 mV over the full input
common-mode voltage range.
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
(2) The signaling rate of a line is the number of voltage
transitions that are made per second expressed in the units
bps (bits per second).
ORDERING INFORMATION⁽¹⁾
T_A
–55°C to 125°C
PACKAGE ⁽²⁾
SOIC - D
Reel of 2500
SOIC - D
Reel of 2500
ORDERABLE PART NUMBER
SN65LVDS33MDREP
SN65LVDT33MDREP ⁽³⁾
TOP-SIDE MARKING
LVDS33M
LVDT33M
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(3) Product Preview
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2007, Texas Instruments Incorporated