SN65LBC172A_16 Datasheet, PDF (1/22 Pages) Texas Instruments – QUADRUPLE RS-485 DIFFERENTIAL LINE DRIVERS

SN65LBC172A, SN75LBC172A
QUADRUPLE RSĆ485 DIFFERENTIAL LINE DRIVERS
D Designed for TIA/EIA-485, TIA/EIA-422,
and ISO 8482 Applications
D Signaling Rates^† up to 30 Mbps
D Propagation Delay Times <11 ns
D Low Standby Power Consumption
1.5 mA Max
D Output ESD Protection 12 kV
SLLS447C − OCTOBER 2000 − REVISED AUGUST 2008
D Driver Positive- and Negative-Current
Limiting
D Power-Up and Power-Down Glitch-Free for
Live Insertion Applications
D Thermal Shutdown Protection
D Industry Standard Pin-Out, Compatible
With SN75172, AM26LS31, DS96172,
LTC486, and MAX3045
description
The SN65LBC172A and SN75LBC172A are quadruple differential line drivers with 3-state outputs, designed
for TIA/EIA-485 (RS-485), TIA/EIA-422 (RS-422), and ISO 8482 applications.
N PACKAGE
(TOP VIEW)
1A 1
1Y 2
1Z 3
G4
2Z 5
2Y 6
2A 7
GND 8
16 V_CC
15 4A
14 4Y
13 4Z
12 G
11 3Z
10 3Y
9 3A
1A
1Y
1Z
G
2Z
2Y
2A
GND
16-DW PACKAGE
(TOP VIEW)
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
logic diagram (positive logic)
V_CC
4A
4Y
4Z
G
3Z
3Y
3A
G4
G ¹²
1A ¹
2A ⁷
3A ⁹
2 _1Y
3 _1Z
6 _2Y
5 _2Z
10 _3Y
11 _3Z
4A ¹⁵
14 _4Y
13 _4Z
20-DW PACKAGE
(TOP VIEW)
logic diagram (positive logic)
1A
1
1Y
2
NC
3
1Z
4
G
5
2Z
6
NC
7
2Y
8
2A
9
GND
10
20
V_CC
19
4A
18
4Y
17
NC
16
4Z
15
G
14
3Z
13
NC
12
3Y
11
3A
G5
G ¹⁵
1A ¹
2A ⁹
3A ¹¹
4A ¹⁹
2 _1Y
4 _1Z
8 _2Y
6 _2Z
12 _3Y
14 _3Z
18 _4Y
16 _4Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinBiCMOS is a trademark of Texas Instruments.
†The _{signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).}
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2008 − 2003, Texas Instruments Incorporated
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